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Information card for entry 4132325
Preview
Coordinates | 4132325.cif |
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Original paper (by DOI) | HTML |
Formula | C50 H52 Br2 N2 Ni |
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Calculated formula | C50 H52 Br2 N2 Ni |
SMILES | Br[Ni]1(Br)[N](c2c(C(c3ccccc3)(C)C)cc(cc2)C(C)(C)C)=C2C(=[N]1c1ccc(cc1C(c1ccccc1)(C)C)C(C)(C)C)c1cccc3cccc2c13 |
Title of publication | Synthesis of Semicrystalline Polyolefin Materials: Precision Methyl Branching via Stereoretentive Chain Walking. |
Authors of publication | Vaccarello, David N.; O'Connor, Kyle S; Iacono, Pasquale; Rose, Jeffrey M.; Cherian, Anna E.; Coates, Geoffrey W. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2018 |
Journal volume | 140 |
Journal issue | 20 |
Pages of publication | 6208 - 6211 |
a | 9.04574 ± 0.00005 Å |
b | 25.29692 ± 0.00013 Å |
c | 19.03833 ± 0.00011 Å |
α | 90° |
β | 103.191 ± 0.0005° |
γ | 90° |
Cell volume | 4241.58 ± 0.04 Å3 |
Cell temperature | 100.01 ± 0.1 K |
Ambient diffraction temperature | 100.01 ± 0.1 K |
Number of distinct elements | 5 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/c 1 |
Hall space group symbol | -P 2ybc |
Residual factor for all reflections | 0.0274 |
Residual factor for significantly intense reflections | 0.0254 |
Weighted residual factors for significantly intense reflections | 0.0661 |
Weighted residual factors for all reflections included in the refinement | 0.0671 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.036 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 1.54184 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4132325.html
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