Information card for entry 4132342
| Formula |
C29 H24 N4 O3 |
| Calculated formula |
C29 H24 N4 O3 |
| SMILES |
O1C2(N(c3c(C2(C)C)c(ccc3c2ccncc2)c2ccncc2)C)C=Cc2cc(N(=O)=O)ccc12 |
| Title of publication |
Flipping the Switch: Fast Photoisomerization in a Confined Environment. |
| Authors of publication |
Williams, Derek E.; Martin, Corey R.; Dolgopolova, Ekaterina A.; Swifton, Anton; Godfrey, Danielle C.; Ejegbavwo, Otega A.; Pellechia, Perry J.; Smith, Mark D.; Shustova, Natalia B. |
| Journal of publication |
Journal of the American Chemical Society |
| Year of publication |
2018 |
| Journal volume |
140 |
| Journal issue |
24 |
| Pages of publication |
7611 - 7622 |
| a |
8.9034 ± 0.0003 Å |
| b |
10.004 ± 0.0004 Å |
| c |
15.0137 ± 0.0006 Å |
| α |
92.406 ± 0.001° |
| β |
105.717 ± 0.001° |
| γ |
113.904 ± 0.001° |
| Cell volume |
1159.22 ± 0.08 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0688 |
| Residual factor for significantly intense reflections |
0.043 |
| Weighted residual factors for significantly intense reflections |
0.0894 |
| Weighted residual factors for all reflections included in the refinement |
0.0991 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.005 |
| Diffraction radiation probe |
x-ray |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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https://www.crystallography.net/4132342.html