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Information card for entry 4132568
Preview
| Coordinates | 4132568.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H22 Cl2 N2 O6 Pd S2 |
|---|---|
| Calculated formula | C16 H22 Cl2 N2 O6 Pd S2 |
| SMILES | C(=O)(c1cc[n](cc1)[Pd]([n]1ccc(C(=O)O)cc1)(Cl)Cl)O.O=S(C)C.O=S(C)C |
| Title of publication | Exposed Equatorial Positions of Metal Centers via Sequential Ligand Elimination and Installation in MOFs. |
| Authors of publication | Yuan, Shuai; Zhang, Peng; Zhang, Liangliang; Garcia-Esparza, Angel T; Sokaras, Dimosthenis; Qin, Jun-Sheng; Feng, Liang; Day, Gregory S.; Chen, Wenmiao; Drake, Hannah F.; Elumalai, Palani; Madrahimov, Sherzod T.; Sun, Daofeng; Zhou, Hong-Cai |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 34 |
| Pages of publication | 10814 - 10819 |
| a | 5.5954 ± 0.0004 Å |
| b | 8.3386 ± 0.0006 Å |
| c | 12.7456 ± 0.0008 Å |
| α | 99.2697 ± 0.0018° |
| β | 101.056 ± 0.0019° |
| γ | 98.754 ± 0.002° |
| Cell volume | 565.64 ± 0.07 Å3 |
| Cell temperature | 110 ± 2 K |
| Ambient diffraction temperature | 110 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.025 |
| Residual factor for significantly intense reflections | 0.0228 |
| Weighted residual factors for significantly intense reflections | 0.0593 |
| Weighted residual factors for all reflections included in the refinement | 0.0605 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.244 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4132568.html
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Users of the data should acknowledge the original authors of the
structural data.