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Information card for entry 4132648
Preview
| Coordinates | 4132648.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C31 H55 N3 Si Ti |
|---|---|
| Calculated formula | C31 H55 N3 Si Ti |
| SMILES | [Ti]234567(N(C(C)(C)C)[Si]([c]12[c]3([c]6([c]7([c]41C)C)C)C)(C)C)([N](=[C]15CC(=C(C1)C)C)C(C)(C)C)C#[N]C(C)(C)C |
| Title of publication | Insertion of Isonitriles into the M-C Bonds of Group 4 Dialkyl Complexes. |
| Authors of publication | Chen, Jiawei; Yassin, Nadine; Gunasekara, Thilina; Norton, Jack R.; Rauch, Michael |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 28 |
| Pages of publication | 8980 - 8989 |
| a | 19.119 ± 0.002 Å |
| b | 10.0925 ± 0.0012 Å |
| c | 17.663 ± 0.002 Å |
| α | 90° |
| β | 104.751 ± 0.002° |
| γ | 90° |
| Cell volume | 3295.9 ± 0.6 Å3 |
| Cell temperature | 190 ± 2 K |
| Ambient diffraction temperature | 190 ± 2 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0696 |
| Residual factor for significantly intense reflections | 0.0442 |
| Weighted residual factors for significantly intense reflections | 0.1101 |
| Weighted residual factors for all reflections included in the refinement | 0.1265 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.969 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4132648.html
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Users of the data should acknowledge the original authors of the
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