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Information card for entry 4132760
Preview
| Coordinates | 4132760.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C44 H62 I N2 P2 U |
|---|---|
| Calculated formula | C44 H62 I N2 P2 U |
| SMILES | c12ccc(cc1[P](C(C)C)([U]1(I)(N2c2c(cc(cc2C)C)C)N(c2ccc(cc2[P]1(C(C)C)C(C)C)C)c1c(cc(cc1C)C)C)C(C)C)C |
| Title of publication | C-H Bond Addition across a Transient Uranium-Nitrido Moiety and Formation of a Parent Uranium Imido Complex. |
| Authors of publication | Mullane, Kimberly C.; Ryu, Ho; Cheisson, Thibault; Grant, Lauren N.; Park, Ji Young; Manor, Brian C.; Carroll, Patrick J.; Baik, Mu-Hyun; Mindiola, Daniel J.; Schelter, Eric J. |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 36 |
| Pages of publication | 11335 - 11340 |
| a | 12.4461 ± 0.0004 Å |
| b | 15.3301 ± 0.0005 Å |
| c | 11.6893 ± 0.0003 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 2230.32 ± 0.12 Å3 |
| Cell temperature | 100 K |
| Ambient diffraction temperature | 100 ± 1 K |
| Number of distinct elements | 6 |
| Space group number | 18 |
| Hermann-Mauguin space group symbol | P 21 21 2 |
| Hall space group symbol | P 2 2ab |
| Residual factor for all reflections | 0.045 |
| Residual factor for significantly intense reflections | 0.0299 |
| Weighted residual factors for significantly intense reflections | 0.0656 |
| Weighted residual factors for all reflections included in the refinement | 0.0707 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.005 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4132760.html
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Users of the data should acknowledge the original authors of the
structural data.