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Information card for entry 4132760
Preview
Coordinates | 4132760.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C44 H62 I N2 P2 U |
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Calculated formula | C44 H62 I N2 P2 U |
SMILES | c12ccc(cc1[P](C(C)C)([U]1(I)(N2c2c(cc(cc2C)C)C)N(c2ccc(cc2[P]1(C(C)C)C(C)C)C)c1c(cc(cc1C)C)C)C(C)C)C |
Title of publication | C-H Bond Addition across a Transient Uranium-Nitrido Moiety and Formation of a Parent Uranium Imido Complex. |
Authors of publication | Mullane, Kimberly C.; Ryu, Ho; Cheisson, Thibault; Grant, Lauren N.; Park, Ji Young; Manor, Brian C.; Carroll, Patrick J.; Baik, Mu-Hyun; Mindiola, Daniel J.; Schelter, Eric J. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2018 |
Journal volume | 140 |
Journal issue | 36 |
Pages of publication | 11335 - 11340 |
a | 12.4461 ± 0.0004 Å |
b | 15.3301 ± 0.0005 Å |
c | 11.6893 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2230.32 ± 0.12 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 ± 1 K |
Number of distinct elements | 6 |
Space group number | 18 |
Hermann-Mauguin space group symbol | P 21 21 2 |
Hall space group symbol | P 2 2ab |
Residual factor for all reflections | 0.045 |
Residual factor for significantly intense reflections | 0.0299 |
Weighted residual factors for significantly intense reflections | 0.0656 |
Weighted residual factors for all reflections included in the refinement | 0.0707 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.005 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4132760.html
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