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Information card for entry 4132902
Preview
Coordinates | 4132902.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C9 H3 Fe12 In48 N0 O15 S93 |
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Calculated formula | C9 H3 Fe12 In48 O15 S93 |
SMILES | c1(cc(cc(c1)C(=O)O[In]12S[In]34[S]5[Fe]67S89[Fe]%10%11[S]%12[In]%13%14[S]7[In]7%15S[In]([OH2])(S%13)S[In]%13%12S[In]%12%16[S]%17[Fe]9([S]([In]5(S1)S7)[In]1([S]3[Fe]38[S]5[In]7([S][In]8([OH2])S[In]([S]6[In]5(S4)S8)([S]%107)S%14)S[In]4(S[In]([OH2])(S%12)S[In]%17(S1)[S]34)[S]%11%16)S2)[S]%15%13)C(=O)O[In]12S[In]34[S]5[Fe]67S89[Fe]%10%11[S]%12[In]%13%14[S]7[In]7%15S[In]([OH2])(S%13)S[In]%13%12S[In]%12%16[S]%17[Fe]9([S]([In]5(S1)S7)[In]1([S]3[Fe]38[S]5[In]7(S[In]8([OH2])S[In]([S]6[In]5(S4)S8)([S]%107)S%14)S[In]4(S[In]([OH2])(S%12)S[In]%17(S1)[S]34)[S]%11%16)S2)[S]%15%13)C(=O)O[In]12S[In]34[S]5[Fe]67S89[Fe]%10%11[S]%12[In]%13%14[S]7[In]7%15S[In]([OH2])(S%13)S[In]%13%12S[In]%12%16[S]%17[Fe]9([S]([In]5(S1)S7)[In]1([S]3[Fe]38[S]5[In]7(S[In]8([OH2])S[In]([S]6[In]5(S4)S8)([S]%107)S%14)S[In]4(S[In]([OH2])(S%12)S[In]%17(S1)[S]34)[S]%11%16)S2)[S]%15%13 |
Title of publication | The Largest Supertetrahedral Oxychalcogenide Nanocluster and Its Unique Assembly. |
Authors of publication | Yang, Huajun; Zhang, Jiaxu; Luo, Min; Wang, Wei; Lin, Haiping; Li, Youyong; Li, Dongsheng; Feng, Pingyun; Wu, Tao |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2018 |
Journal volume | 140 |
Journal issue | 36 |
Pages of publication | 11189 - 11192 |
a | 37.421 ± 0.003 Å |
b | 37.421 ± 0.003 Å |
c | 20.6962 ± 0.0017 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 25099 ± 4 Å3 |
Cell temperature | 120 ± 2 K |
Ambient diffraction temperature | 120 ± 2 K |
Number of distinct elements | 7 |
Space group number | 176 |
Hermann-Mauguin space group symbol | P 63/m |
Hall space group symbol | -P 6c |
Residual factor for all reflections | 0.1218 |
Residual factor for significantly intense reflections | 0.0792 |
Weighted residual factors for significantly intense reflections | 0.2103 |
Weighted residual factors for all reflections included in the refinement | 0.2286 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.156 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4132902.html
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