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Information card for entry 4133397
Preview
Coordinates | 4133397.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C52 H52 Cl4 Ge2 N2 O4 Zn |
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Calculated formula | C52 H52 Cl4 Ge2 N2 O4 Zn |
SMILES | [Ge](/C=C1\[Zn]2([O]=C3OCC(N13)(C)C)[O]=C1OCC(N1/C2=C/[Ge](c1ccccc1)(c1ccccc1)c1ccccc1)(C)C)(c1ccccc1)(c1ccccc1)c1ccccc1.ClCCl.ClCCl |
Title of publication | Radical Germylzincation of α-Heteroatom-Substituted Alkynes. |
Authors of publication | de la Vega-Hernández, Karen; Romain, Elise; Coffinet, Anais; Bijouard, Kajetan; Gontard, Geoffrey; Chemla, Fabrice; Ferreira, Franck; Jackowski, Olivier; Perez-Luna, Alejandro |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2018 |
Journal volume | 140 |
Journal issue | 50 |
Pages of publication | 17632 - 17642 |
a | 21.4118 ± 0.0005 Å |
b | 12.0493 ± 0.0002 Å |
c | 39.1926 ± 0.0008 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 10111.6 ± 0.4 Å3 |
Cell temperature | 200 ± 1 K |
Ambient diffraction temperature | 200 ± 1 K |
Number of distinct elements | 7 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0726 |
Residual factor for significantly intense reflections | 0.0486 |
Weighted residual factors for significantly intense reflections | 0.1156 |
Weighted residual factors for all reflections included in the refinement | 0.126 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.023 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4133397.html
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