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Information card for entry 4133411
Preview
| Coordinates | 4133411.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C352 H180 Co12 P12 Te16 |
|---|---|
| Calculated formula | C352.14 H180 Co12 P12 Te16 |
| Title of publication | Spontaneous Electronic Band Formation and Switchable Behaviors in a Phase-Rich Superatomic Crystal. |
| Authors of publication | O'Brien, Evan S; Russell, Jake C.; Bartnof, Matthew; Christodoulides, Alexander D.; Lee, Kihong; DeGayner, Jordan A.; Paley, Daniel W.; McGaughey, Alan J. H.; Ong, Wee-Liat; Malen, Jonathan A.; Zhu, X.-Y.; Roy, Xavier |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 46 |
| Pages of publication | 15601 - 15605 |
| a | 25.3864 ± 0.0006 Å |
| b | 16.3196 ± 0.0003 Å |
| c | 28.8221 ± 0.0006 Å |
| α | 90° |
| β | 92.581 ± 0.002° |
| γ | 90° |
| Cell volume | 11928.8 ± 0.4 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100.15 K |
| Number of distinct elements | 5 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/n 1 |
| Hall space group symbol | -P 2yn |
| Residual factor for all reflections | 0.069 |
| Residual factor for significantly intense reflections | 0.0454 |
| Weighted residual factors for significantly intense reflections | 0.0782 |
| Weighted residual factors for all reflections included in the refinement | 0.0869 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
| Diffraction radiation probe | x-ray |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4133411.html
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