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Information card for entry 4133427
Preview
| Coordinates | 4133427.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | jf130_200K |
|---|---|
| Formula | C78 H61 Cl3.5 O1.5 |
| Calculated formula | C78 H61 Cl3.5 O1.5 |
| Title of publication | π-Extended Corannulene-Based Nanographenes: Selective Formation of Negative Curvature. |
| Authors of publication | Fernández-García, Jesús M; Evans, Paul J.; Medina Rivero, Samara; Fernández, Israel; García-Fresnadillo, David; Perles, Josefina; Casado, Juan; Martín, Nazario |
| Journal of publication | Journal of the American Chemical Society |
| Year of publication | 2018 |
| Journal volume | 140 |
| Journal issue | 49 |
| Pages of publication | 17188 - 17196 |
| a | 12.7107 ± 0.0005 Å |
| b | 16.888 ± 0.0007 Å |
| c | 17.1768 ± 0.0008 Å |
| α | 93.094 ± 0.002° |
| β | 100.081 ± 0.002° |
| γ | 107.113 ± 0.002° |
| Cell volume | 3447.6 ± 0.3 Å3 |
| Cell temperature | 200 ± 2 K |
| Ambient diffraction temperature | 200 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.2383 |
| Residual factor for significantly intense reflections | 0.1801 |
| Weighted residual factors for significantly intense reflections | 0.501 |
| Weighted residual factors for all reflections included in the refinement | 0.552 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.216 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4133427.html
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Users of the data should acknowledge the original authors of the
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