Information card for entry 4133602

Structure parameters

• Formula: C45 H58 Cl2 Ge N4 O Si2
• Calculated formula: C45 H58 Cl2 Ge N4 O Si2
• SMILES: [Ge]1(Cl)[Si]2(Cl)([N](=C(N2C(C)(C)C)c2ccccc2)C(C)(C)C)c2c3Oc4c(cccc4C(c3ccc2)(C)C)[Si]21[N](C(C)(C)C)=C(N2C(C)(C)C)c1ccccc1
• Title of publication: An Isolable Bis(silylene)-Stabilized Germylone and Its Reactivity.
• Authors of publication: Wang, Yuwen; Karni, Miriam; Yao, Shenglai; Apeloig, Yitzhak; Driess, Matthias
• Journal of publication: Journal of the American Chemical Society
• Year of publication: 2019
• Journal volume: 141
• Journal issue: 4
• Pages of publication: 1655 - 1664
• a: 18.8289 ± 0.0002 Å
• b: 15.5259 ± 0.0002 Å
• c: 17.5625 ± 0.0002 Å
• α: 90°
• β: 90°
• γ: 90°
• Cell volume: 5134.14 ± 0.1 ų
• Cell temperature: 150 ± 2 K
• Ambient diffraction temperature: 150 ± 2 K
• Number of distinct elements: 7
• Space group number: 29
• Hermann-Mauguin space group symbol: P c a 21
• Hall space group symbol: P 2c -2ac
• Residual factor for all reflections: 0.0432
• Residual factor for significantly intense reflections: 0.0413
• Weighted residual factors for significantly intense reflections: 0.1096
• Weighted residual factors for all reflections included in the refinement: 0.1119
• Goodness-of-fit parameter for all reflections included in the refinement: 1.029
• Diffraction radiation wavelength: 1.54184 Å
• Diffraction radiation type: CuKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No