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Information card for entry 4133683
Preview
Coordinates | 4133683.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C21 H54 Si6 |
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Calculated formula | C21 H54 Si6 |
SMILES | [Si]1([SiH]([Si]([Si](C)(C)C)([Si](C)(C)C)[Si](C)(C)C)CC1(C)C)(C(C)(C)C)C(C)(C)C |
Title of publication | Disilene-Silylene Interconversion: A Synthetically Accessible Acyclic Bis(silyl)silylene. |
Authors of publication | Reiter, Dominik; Holzner, Richard; Porzelt, Amelie; Altmann, Philipp J.; Frisch, Philipp; Inoue, Shigeyoshi |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 34 |
Pages of publication | 13536 - 13546 |
a | 12.4962 ± 0.001 Å |
b | 14.8445 ± 0.001 Å |
c | 17.5284 ± 0.0014 Å |
α | 90° |
β | 108.895 ± 0.003° |
γ | 90° |
Cell volume | 3076.3 ± 0.4 Å3 |
Cell temperature | 100 K |
Ambient diffraction temperature | 100 K |
Number of distinct elements | 3 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0348 |
Residual factor for significantly intense reflections | 0.0282 |
Weighted residual factors for significantly intense reflections | 0.0661 |
Weighted residual factors for all reflections included in the refinement | 0.0692 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4133683.html
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