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Information card for entry 4133689
Preview
Coordinates | 4133689.cif |
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Original paper (by DOI) | HTML |
Formula | C66 H54 Al N6 O4 |
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Calculated formula | C66 H54 Al N6 O4 |
SMILES | [Al]1234([N](c5c(OC)cccc5)=C(c5ccccc5)c5[n]1c(ccc5)C(=[N]2c1c(OC)cccc1)c1ccccc1)[N](c1c(OC)cccc1)=C(c1ccccc1)c1[n]3c(ccc1)C(=[N]4c1c(OC)cccc1)c1ccccc1 |
Title of publication | Organic Electron Delocalization Modulated by Ligand Charge States in [L<sub>2</sub>M]<sup> <i>n-</i> </sup> Complexes of Group 13 Ions. |
Authors of publication | Arnold, Amela; Sherbow, Tobias J.; Sayler, Richard I.; Britt, R. David; Thompson, Emily J.; Muñoz, M Teresa; Fettinger, James C.; Berben, Louise A. |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 40 |
Pages of publication | 15792 - 15803 |
a | 13.5799 ± 0.0003 Å |
b | 13.5799 ± 0.0003 Å |
c | 37.5593 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6926.4 ± 0.3 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 5 |
Space group number | 76 |
Hermann-Mauguin space group symbol | P 41 |
Hall space group symbol | P 4w |
Residual factor for all reflections | 0.0481 |
Residual factor for significantly intense reflections | 0.0438 |
Weighted residual factors for significantly intense reflections | 0.1154 |
Weighted residual factors for all reflections included in the refinement | 0.1182 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.047 |
Diffraction radiation wavelength | 1.54178 Å |
Diffraction radiation type | CuKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4133689.html
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