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Information card for entry 4133787
Preview
Coordinates | 4133787.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C57 H93 K N5 O7 Sc Si |
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Calculated formula | C57 H93 K N5 O7 Sc Si |
SMILES | [Sc]123456(O/C(=N\[Si](C)(C)C)C(=C2c2ccccc2)c2ccccc2)([N](=C(N1C(C)C)CCCC)C(C)C)[c]1([c]3([c]6([c]5([c]41C)C)C)C)C.[K]1234567[O]8CC[N]96CC[O]2CC[O]3CC[N]7(CC[O]1CC8)CC[O]5CC[O]4CC9 |
Title of publication | Well-Defined Scandacyclopropenes: Synthesis, Structure, and Reactivity. |
Authors of publication | Lv, Ze-Jie; Huang, Zhe; Shen, Jinghang; Zhang, Wen-Xiong; Xi, Zhenfeng |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 51 |
Pages of publication | 20547 - 20555 |
a | 10.8626 ± 0.0002 Å |
b | 16.8834 ± 0.0004 Å |
c | 33.3909 ± 0.0007 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6123.8 ± 0.2 Å3 |
Cell temperature | 180 ± 0.1 K |
Ambient diffraction temperature | 180 ± 0.1 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0403 |
Residual factor for significantly intense reflections | 0.0348 |
Weighted residual factors for significantly intense reflections | 0.0812 |
Weighted residual factors for all reflections included in the refinement | 0.0835 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.018 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4133787.html
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Users of the data should acknowledge the original authors of the
structural data.