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Information card for entry 4133897
Preview
Coordinates | 4133897.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C120 H268 Ag6 Cl8 N7 O68 Si2 W18 |
---|---|
Calculated formula | C120 H268 Ag6 Cl8 N7 O68 Si2 W18 |
SMILES | [N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.[O]123[W]456(O[W]781(O[W]19%10([O]%11%12[Ag]%13%14%15%16([O]=1)[Ag]1%17%18%19%202[Ag]2%21%22%13([O]%13%23[W]%24(=[O]2)(O4)(O[W]2%23(O[W]4%23([O]%25([W](O5)(O%24)(O[W]%25(O7)(O%10)(O%23)=O)(O4)=O)[Si]3%11%13)(O[W]%12(O9)(=[O]%14)(O2)=O)=O)(=[O]%21)=O)=O)[Ag]2345%20[O]79[W]%10%11(=[O]3)(O[W]37(=[O]2)(O[W]27%12([O]%13%14[W]%20(=[O][Ag]%15%194%13([O]=2)[Ag]%16%225([OH2])[OH2])(O[W]24([O]51[W]([O]6%18)(O2)(O%10)(O[W]12([O]6([W](O4)(O%20)(O1)(O[W]6(O%12)(O3)(O2)=O)=O)[Si]9%145)(O%11)=O)=O)([O]8%17)=O)(O7)=O)=O)=O)=O)=O)=O)=O.C(CCl)Cl.C(CCl)Cl.[N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.[N+](CCCC)(CCCC)(CCCC)CCCC.C(CCl)Cl.C(CCl)Cl |
Title of publication | Controlled Assembly Synthesis of Atomically Precise Ultrastable Silver Nanoclusters with Polyoxometalates. |
Authors of publication | Yonesato, Kentaro; Ito, Hiroyasu; Itakura, Hiroyuki; Yokogawa, Daisuke; Kikuchi, Takashi; Mizuno, Noritaka; Yamaguchi, Kazuya; Suzuki, Kosuke |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2019 |
Journal volume | 141 |
Journal issue | 50 |
Pages of publication | 19550 - 19554 |
a | 40.0068 ± 0.0006 Å |
b | 16.6856 ± 0.0002 Å |
c | 29.7859 ± 0.0005 Å |
α | 90° |
β | 100.207 ± 0.0016° |
γ | 90° |
Cell volume | 19568.6 ± 0.5 Å3 |
Cell temperature | 123 ± 2 K |
Ambient diffraction temperature | 123 ± 2 K |
Number of distinct elements | 8 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0627 |
Residual factor for significantly intense reflections | 0.0446 |
Weighted residual factors for significantly intense reflections | 0.0957 |
Weighted residual factors for all reflections included in the refinement | 0.103 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.034 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4133897.html
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