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Information card for entry 4133982
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Coordinates | 4133982.cif |
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Original paper (by DOI) | HTML |
Formula | Ga27 Rb8 Sb19 |
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Calculated formula | Ga27 Rb8 Sb19 |
Title of publication | III-V Clathrate Semiconductors with Outstanding Hole Mobility: Cs<sub>8</sub>In<sub>27</sub>Sb<sub>19</sub> and <i>A</i><sub>8</sub>Ga<sub>27</sub>Sb<sub>19</sub> (<i>A</i> = Cs, Rb). |
Authors of publication | Owens-Baird, Bryan; Wang, Jian; Wang, Suyin Grass; Chen, Yu-Sheng; Lee, Shannon; Donadio, Davide; Kovnir, Kirill |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2020 |
Journal volume | 142 |
Journal issue | 4 |
Pages of publication | 2031 - 2041 |
a | 22.8962 ± 0.00004 Å |
b | 22.8962 ± 0.00004 Å |
c | 22.8962 ± 0.00004 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 12003 ± 0.04 Å3 |
Cell temperature | 293 K |
Ambient diffraction temperature | 293 K |
Number of distinct elements | 3 |
Space group number | 206 |
Hermann-Mauguin space group symbol | I a -3 |
Hall space group symbol | -I 2b 2c 3 |
Residual factor for all reflections | 0.0514 |
Residual factor for significantly intense reflections | 0.0426 |
Weighted residual factors for all reflections | 0.0508 |
Weighted residual factors for significantly intense reflections | 0.0499 |
Goodness-of-fit parameter for all reflections | 1.32 |
Method of determination | powder diffraction |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.41275 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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