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Information card for entry 4134264
Preview
Coordinates | 4134264.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C53 H50 Cl2 F6 S6 Sb |
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Calculated formula | C53 H50 Cl2 F6 S6 Sb |
SMILES | [Sb](F)(F)(F)(F)(F)[F-].s1c2C=Cc3sc(cc3)C#Cc3sc(C#Cc4sc(C=Cc5sc(cc5)C#Cc5sc(C#Cc1cc2)c(CCCC)c5CCCC)cc4)c(CCCC)c3CCCC.C(Cl)Cl |
Title of publication | Preparation, Spectroscopic Characterization and Theoretical Study of a Three-Dimensional Conjugated 70 π-Electron Thiophene 6-mer Radical Cation π-Dimer |
Authors of publication | Fujiwara, Toshihiro; Muranaka, Atsuya; Nishinaga, Tohru; Aoyagi, Shinobu; Kobayashi, Nagao; Uchiyama, Masanobu; Otani, Hiroyuki; Iyoda, Masahiko |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2020 |
a | 14.1298 ± 0.0016 Å |
b | 38.475 ± 0.004 Å |
c | 38.518 ± 0.004 Å |
α | 90° |
β | 93.824 ± 0.007° |
γ | 90° |
Cell volume | 20893 ± 4 Å3 |
Cell temperature | 90 ± 2 K |
Ambient diffraction temperature | 90 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.2195 |
Residual factor for significantly intense reflections | 0.1667 |
Weighted residual factors for significantly intense reflections | 0.3627 |
Weighted residual factors for all reflections included in the refinement | 0.3857 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.83 |
Diffraction radiation wavelength | 0.4139 Å |
Diffraction radiation type | synchrotron |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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