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Information card for entry 4134387
Preview
Coordinates | 4134387.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C77 H67.5 N2.5 O4 Pr Si4 |
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Calculated formula | C77 H67.5 N2.5 O4 Pr Si4 |
SMILES | [Pr](O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)(O[Si](c1ccccc1)(c1ccccc1)c1ccccc1)([N]#CC)[N]#CC.N#CC |
Title of publication | Accessing the +IV Oxidation State in Molecular Complexes of Praseodymium. |
Authors of publication | Willauer, Aurélien R; Palumbo, Chad T.; Fadaei-Tirani, Farzaneh; Zivkovic, Ivica; Douair, Iskander; Maron, Laurent; Mazzanti, Marinella |
Journal of publication | Journal of the American Chemical Society |
Year of publication | 2020 |
Journal volume | 142 |
Journal issue | 12 |
Pages of publication | 5538 - 5542 |
a | 22.4784 ± 0.0003 Å |
b | 24.2398 ± 0.0003 Å |
c | 25.1777 ± 0.0003 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 13718.6 ± 0.3 Å3 |
Cell temperature | 140 ± 0.1 K |
Ambient diffraction temperature | 140 ± 0.1 K |
Number of distinct elements | 6 |
Space group number | 29 |
Hermann-Mauguin space group symbol | P c a 21 |
Hall space group symbol | P 2c -2ac |
Residual factor for all reflections | 0.0472 |
Residual factor for significantly intense reflections | 0.0406 |
Weighted residual factors for significantly intense reflections | 0.1008 |
Weighted residual factors for all reflections included in the refinement | 0.1075 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.076 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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