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Information card for entry 4300008
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Coordinates | 4300008.cif |
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Original paper (by DOI) | HTML |
Common name | 1,3-bis(diphenylphosphino)propane maleneonitrilediselenolate nickel(ii) |
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Chemical name | 1,3-bis(diphenylphosphino)propane cis-1,2-dicyano,1,2-diselenato-ethene-Se-Se-nickel(ii) |
Formula | C31 H26 N2 Ni P2 Se2 |
Calculated formula | C31 H26 N2 Ni P2 Se2 |
SMILES | C1(=C(C#N)[Se][Ni]2([P](c3ccccc3)(c3ccccc3)CCC[P]2(c2ccccc2)c2ccccc2)[Se]1)C#N |
Title of publication | Facile Syntheses and Structures of New Metal-Maleonitrilediselenolates [K([2.2.2]-cryptand)]3[Ag(Se2C2(CN)2)(Se6)], [K([2.2.2]-cryptand)]2[Ni(Se2C2(CN)2)2], and Ni(dppp)(Se2C2(CN)2) |
Authors of publication | Craig C. McLauchlan; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2000 |
Journal volume | 39 |
Pages of publication | 1046 - 1048 |
a | 12.4004 ± 0.0007 Å |
b | 15.4068 ± 0.0009 Å |
c | 15.4512 ± 0.0009 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 2952 ± 0.3 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 62 |
Hermann-Mauguin space group symbol | P n m a |
Hall space group symbol | -P 2ac 2n |
Residual factor for all reflections | 0.039 |
Residual factor for significantly intense reflections | 0.0263 |
Weighted residual factors for significantly intense reflections | 0.0593 |
Weighted residual factors for all reflections included in the refinement | 0.0614 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.099 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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