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Information card for entry 4300152
Preview
Coordinates | 4300152.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C72 H60 N3 P6 S6 Y |
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Calculated formula | C72 H60 N3 P6 S6 Y |
SMILES | c1ccccc1P1(=[N]2[Y]3456([N](P(c7ccccc7)(c7ccccc7)=[S]3)=P(c3ccccc3)(c3ccccc3)S5)([N](=P(c3ccccc3)(c3ccccc3)S4)P(c3ccccc3)(c3ccccc3)=[S]6)(S1)[S]=P2(c1ccccc1)c1ccccc1)c1ccccc1 |
Title of publication | Soluble Yttrium Chalcogenides: Syntheses, Structures, and NMR Properties of Y[η3-N(SPPh2)2]3 and Y[η2-N(SePPh2)2]2[η3-N(SePPh2)2] |
Authors of publication | Christopher G. Pernin; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2000 |
Journal volume | 39 |
Pages of publication | 1222 - 1226 |
a | 14.927 ± 0.005 Å |
b | 14.927 ± 0.005 Å |
c | 56.047 ± 0.013 Å |
α | 90° |
β | 90° |
γ | 120° |
Cell volume | 10815 ± 6 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 6 |
Space group number | 167 |
Hermann-Mauguin space group symbol | R -3 c :H |
Hall space group symbol | -R 3 2"c |
Residual factor for all reflections | 0.0822 |
Residual factor for significantly intense reflections | 0.0424 |
Weighted residual factors for significantly intense reflections | 0.0797 |
Weighted residual factors for all reflections included in the refinement | 0.0908 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.938 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4300152.html
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