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Information card for entry 4301545
Preview
Coordinates | 4301545.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C90 H114 Cl2 N6 O6 Pt |
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Calculated formula | C90 H114 Cl2 N6 O6 Pt |
SMILES | [Pt](Cl)(Cl)([n]1ccc(cc1)OCCCCCC)[n]1ccc(cc1)OCCCCCC.C1CCC2(CC1)c1cc(c(c(c1)C)NC(=O)c1cc(cc(c1)C(C)(C)C)C(=O)Nc1c(cc(C3(CCCCC3)c3cc(c(c(c3)C)NC(=O)c3cc(cc(c3)C(C)(C)C)C(=O)Nc3c(cc2cc3C)C)C)cc1C)C)C |
Title of publication | Stability of [2]Pseudorotaxanes Templated Through Second-Sphere Coordination |
Authors of publication | Barry A. Blight; James A. Wisner; Michael C. Jennings |
Journal of publication | Inorganic Chemistry |
Year of publication | 2009 |
Journal volume | 48 |
Pages of publication | 1920 - 1927 |
a | 12.3822 ± 0.0004 Å |
b | 16.4284 ± 0.0003 Å |
c | 20.8099 ± 0.0005 Å |
α | 90° |
β | 106.077 ± 0.002° |
γ | 90° |
Cell volume | 4067.59 ± 0.18 Å3 |
Cell temperature | 150 ± 2 K |
Ambient diffraction temperature | 150 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0751 |
Residual factor for significantly intense reflections | 0.0455 |
Weighted residual factors for significantly intense reflections | 0.1203 |
Weighted residual factors for all reflections included in the refinement | 0.1332 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.07 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4301545.html
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