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Information card for entry 4301871
Preview
Coordinates | 4301871.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C46 H76 Cl4 N6 O4 Si2 Ta2 |
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Calculated formula | C46 H76 Cl4 N6 O4 Si2 Ta2 |
SMILES | [Ta]123(O[Si](C(C)(C)C)(c4ccccc4)c4ccccc4)(O[Ta](O1)(O[Si](C(C)(C)C)(c1ccccc1)c1ccccc1)([N](CN2C)(C)C)(N(C[N]3(C)C)C)N(C)C)N(C)C.ClCCl.ClCCl |
Title of publication | Synthesis and Characterization of Siloxy, Aminoxy, and Oxo Complexes from the Reaction of a Tantalum Amide Silyl Complex with Oxygen |
Authors of publication | He Qiu; Shu-Jian Chen; Chang-Sheng Wang; Yun-Dong Wu; Ilia A. Guzei; Xue-Tai Chen; Zi-Ling Xue |
Journal of publication | Inorganic Chemistry |
Year of publication | 2009 |
Journal volume | 48 |
Pages of publication | 3073 - 3079 |
a | 10.965 ± 0.003 Å |
b | 14.209 ± 0.003 Å |
c | 18.356 ± 0.004 Å |
α | 82.008 ± 0.004° |
β | 75.331 ± 0.003° |
γ | 89.577 ± 0.003° |
Cell volume | 2738.6 ± 1.1 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0434 |
Residual factor for significantly intense reflections | 0.028 |
Weighted residual factors for significantly intense reflections | 0.0649 |
Weighted residual factors for all reflections included in the refinement | 0.0723 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.969 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | Mo-Kα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4301871.html
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