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Information card for entry 4304425
Preview
Coordinates | 4304425.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C54 H55 N3 Ni O7 V |
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Calculated formula | C54 H55 N3 Ni O7 V |
SMILES | [Ni]1234([O]5[V]6([O]1c1c(C[N]4(CC[N]2(Cc4c5c(cc(c4)C)C)C)C)cc(cc1C)C)([O]=C(C=C(O6)c1ccccc1)c1ccccc1)=O)OC(=CC(=[O]3)c1ccccc1)c1ccccc1.N#CC |
Title of publication | Tetra- and Dinuclear Nickel(II)-Vanadium(IV/V) Heterometal Complexes of a Phenol-Based N2O2 Ligand: Synthesis, Structures, and Magnetic and Redox Properties |
Authors of publication | Debdas Mandal; Pabitra Baran Chatterjee; Rakesh Ganguly; Edward R. T. Tiekink; Rodolphe Clérac; Muktimoy Chaudhury |
Journal of publication | Inorganic Chemistry |
Year of publication | 2008 |
Journal volume | 47 |
Pages of publication | 584 - 591 |
a | 11.2938 ± 0.0004 Å |
b | 12.8014 ± 0.0005 Å |
c | 17.2832 ± 0.0007 Å |
α | 83.331 ± 0.001° |
β | 86.659 ± 0.001° |
γ | 77.124 ± 0.001° |
Cell volume | 2418.07 ± 0.16 Å3 |
Cell temperature | 223 ± 2 K |
Ambient diffraction temperature | 223 ± 2 K |
Number of distinct elements | 6 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.057 |
Residual factor for significantly intense reflections | 0.044 |
Weighted residual factors for significantly intense reflections | 0.111 |
Weighted residual factors for all reflections included in the refinement | 0.12 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.04 |
Diffraction radiation wavelength | 0.71069 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4304425.html
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structural data.