Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4306385
Preview
| Coordinates | 4306385.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C52 H60 N4 O |
|---|---|
| Calculated formula | C52 H60 N4 O |
| SMILES | O(CC)CC.N1=C2C3(N(c4c(N3c3ccc(cc3)C(C)(C)C)cccc4)c3ccc(cc3)C(C)(C)C)C=CC=C2N(c2c1cccc2)c1ccc(cc1)C(C)(C)C |
| Title of publication | Metalloradical Complexes of Manganese and Chromium Featuring an Oxidatively Rearranged Ligand |
| Authors of publication | Remle Çelenligil-Çetin; Patrina Paraskevopoulou; Nikolia Lalioti; Yiannis Sanakis; Richard J. Staples; Nigam P. Rath; Pericles Stavropoulos |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2008 |
| Journal volume | 47 |
| Pages of publication | 10998 - 11009 |
| a | 39.025 ± 0.008 Å |
| b | 12.187 ± 0.002 Å |
| c | 22.221 ± 0.004 Å |
| α | 90° |
| β | 122.573 ± 0.004° |
| γ | 90° |
| Cell volume | 8906 ± 3 Å3 |
| Cell temperature | 193 ± 2 K |
| Ambient diffraction temperature | 193 ± 2 K |
| Number of distinct elements | 4 |
| Space group number | 15 |
| Hermann-Mauguin space group symbol | C 1 2/c 1 |
| Hall space group symbol | -C 2yc |
| Residual factor for all reflections | 0.1683 |
| Residual factor for significantly intense reflections | 0.0799 |
| Weighted residual factors for significantly intense reflections | 0.199 |
| Weighted residual factors for all reflections included in the refinement | 0.2538 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.016 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4306385.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.