Information card for entry 4306762

Structure parameters

• Formula: C16 H32 Ag2 F6 O6 S6 Si2
• Calculated formula: C16 H32 Ag2 F6 O6 S6 Si2
• SMILES: [Ag]123(OS(=O)(=O)C(F)(F)F)[S](C)C4[S]([Ag]5([CH](=[CH2]5)[Si]4(C)C)(OS(=O)(=O)C(F)(F)F)[S](C)C([S]1C)[Si](C)(C)[CH]2=[CH2]3)C
• Title of publication: Silyl-Substituted Thioether Ligands and Their Ag(I) Complexes
• Authors of publication: Chinwon Rim; Hongming Zhang; David Y. Son
• Journal of publication: Inorganic Chemistry
• Year of publication: 2008
• Journal volume: 47
• Pages of publication: 11993 - 12003
• a: 8.2234 ± 0.0009 Å
• b: 10.697 ± 0.0012 Å
• c: 18.346 ± 0.002 Å
• α: 90°
• β: 96.931 ± 0.002°
• γ: 90°
• Cell volume: 1602 ± 0.3 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 7
• Space group number: 14
• Hermann-Mauguin space group symbol: P 1 21/c 1
• Hall space group symbol: -P 2ybc
• Residual factor for all reflections: 0.054
• Residual factor for significantly intense reflections: 0.047
• Weighted residual factors for significantly intense reflections: 0.114
• Weighted residual factors for all reflections included in the refinement: 0.117
• Goodness-of-fit parameter for all reflections included in the refinement: 1.086
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No