Information card for entry 4306795

Structure parameters

• Formula: C44 H64 Dy4 N16 O18
• Calculated formula: C44 H64 Dy4 N16 O18
• SMILES: C1C[N]2=Cc3c4c(ccc3)[O](C)[Dy]3567([O]4[Dy]489%10%112[N](=Cc2c%12[O]%11[Dy]%11%13([OH]4[Dy]4%14%15%16([N](CC[O]54)=Cc4c(c(ccc4)[O]%13C)[O]%11%14)([N](CC[OH]%16)=Cc4c([O]6%15)c([O]7C)ccc4)[OH]38)([O]19)([O](c%12ccc2)C)(N=N#N)N=N#N)CC[OH]%10)(N=N#N)N=N#N.CO.CO.CO.CO
• Title of publication: Anion-Perturbed Magnetic Slow Relaxation in Planar {Dy4} Clusters
• Authors of publication: Yan-Zhen Zheng; Yanhua Lan; Christopher E. Anson; Annie K. Powell
• Journal of publication: Inorganic Chemistry
• Year of publication: 2008
• Journal volume: 47
• Pages of publication: 10813 - 10815
• a: 11.1847 ± 0.0005 Å
• b: 11.3918 ± 0.0005 Å
• c: 13.8717 ± 0.0006 Å
• α: 81.061 ± 0.001°
• β: 66.851 ± 0.001°
• γ: 63.009 ± 0.001°
• Cell volume: 1447.56 ± 0.11 ų
• Cell temperature: 100 ± 2 K
• Ambient diffraction temperature: 100 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0374
• Residual factor for significantly intense reflections: 0.034
• Weighted residual factors for significantly intense reflections: 0.077
• Weighted residual factors for all reflections included in the refinement: 0.0785
• Goodness-of-fit parameter for all reflections included in the refinement: 1.079
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No