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Information card for entry 4307938
Preview
Coordinates | 4307938.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | (Et4N)2[23] |
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Formula | C44 H82 N8 S8 Se2 W2 |
Calculated formula | C44 H82 N8 S8 Se2 W2 |
SMILES | [W]123([Se][W]45([Se]1)(SC(=C(S4)C)C)SC(=C(S5)C)C)(SC(=C(S3)C)C)SC(=C(S2)C)C.N#CC.CC#N.C(#N)C.C(#N)C.[N+](CC)(CC)(CC)CC.[N+](CC)(CC)(CC)CC.C(#N)C.CC#N |
Title of publication | Synthesis and Structures of Bis(dithiolene)tungsten(IV,VI) Thiolate and Selenolate Complexes: Approaches to the Active Sites of Molybdenum and Tungsten Formate Dehydrogenases |
Authors of publication | Stanislav Groysman; R. H. Holm |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 4090 - 4102 |
a | 10.9708 ± 0.0015 Å |
b | 11.675 ± 0.0013 Å |
c | 13.7319 ± 0.0015 Å |
α | 69.463 ± 0.002° |
β | 68.356 ± 0.002° |
γ | 70.839 ± 0.002° |
Cell volume | 1490.5 ± 0.3 Å3 |
Cell temperature | 193 ± 2 K |
Ambient diffraction temperature | 193 ± 2 K |
Number of distinct elements | 6 |
Space group number | 1 |
Hermann-Mauguin space group symbol | P 1 |
Hall space group symbol | P 1 |
Residual factor for all reflections | 0.0285 |
Residual factor for significantly intense reflections | 0.0265 |
Weighted residual factors for significantly intense reflections | 0.07 |
Weighted residual factors for all reflections included in the refinement | 0.0717 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.038 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4307938.html
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structural data.