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Information card for entry 4308260
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Coordinates | 4308260.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | ReCl2(PPh3)2(L-Ph2) |
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Chemical name | Dichloro(N-benzoyl-N',N'-diphenylthioureato-O,S)bis(triphenylphosphine)rhenium(III) |
Formula | C56 H45 Cl2 N2 O P2 Re S |
Calculated formula | C56 H45 Cl2 N2 O P2 Re S |
SMILES | [Re]1(Cl)(Cl)([S]=C(N=C(O1)c1ccccc1)N(c1ccccc1)c1ccccc1)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1 |
Title of publication | Rhenium and Technetium Complexes with N,N-Dialkyl-N'-benzoylthioureas |
Authors of publication | Nguyen Hung Huy; Ulrich Abram |
Journal of publication | Inorganic Chemistry |
Year of publication | 2007 |
Journal volume | 46 |
Pages of publication | 5310 - 5319 |
a | 12.689 ± 0.001 Å |
b | 13.334 ± 0.001 Å |
c | 15.004 ± 0.001 Å |
α | 77.87 ± 0.01° |
β | 85.38 ± 0.01° |
γ | 74.62 ± 0.01° |
Cell volume | 2392.2 ± 0.3 Å3 |
Cell temperature | 200 ± 2 K |
Ambient diffraction temperature | 200 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0471 |
Residual factor for significantly intense reflections | 0.0353 |
Weighted residual factors for significantly intense reflections | 0.0851 |
Weighted residual factors for all reflections included in the refinement | 0.1004 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.978 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4308260.html
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