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Information card for entry 4308490
Preview
Coordinates | 4308490.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H80 N4 Na2 O12 S12 U |
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Calculated formula | C56 H80 N4 Na2 O12 S12 U |
SMILES | [U]123(SC4=C(S1)SCCS4)(SC1=C(S2)SCCS1)SC1=C(S3)SCCS1.[Na]1234([O]5CC[O]1CC[O]2CC[O]3CC[O]4CCOCC5)([n]1ccccc1)[n]1ccccc1.[Na]12345([O]6CC[O]1CC[O]2CC[O]3CC[O]4CC[O]5CC6)([n]1ccccc1)[n]1ccccc1 |
Title of publication | Homoleptic Tris(dithiolene) and Tetrakis(dithiolene) Complexes of Uranium(IV) |
Authors of publication | Mathieu Roger; Thérèse Arliguie; Pierre Thuéry; Marc Fourmigué; Michel Ephritikhine |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 594 - 600 |
a | 10.4901 ± 0.0005 Å |
b | 15.5965 ± 0.0013 Å |
c | 22.578 ± 0.0018 Å |
α | 83.727 ± 0.003° |
β | 80.084 ± 0.005° |
γ | 75.523 ± 0.004° |
Cell volume | 3514.7 ± 0.4 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 7 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0895 |
Residual factor for significantly intense reflections | 0.0531 |
Weighted residual factors for significantly intense reflections | 0.1037 |
Weighted residual factors for all reflections included in the refinement | 0.1155 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.044 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4308490.html
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Users of the data should acknowledge the original authors of the
structural data.