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Information card for entry 4309848
Preview
| Coordinates | 4309848.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C23 H33 F12 N5 O P2 Ru S |
|---|---|
| Calculated formula | C23 H33 F12 N5 O P2 Ru S |
| SMILES | [Ru]123([S](=O)(C)C)([n]4ccccc4c4[n]1c(ccc4)c1[n]2cccc1)[N](CC[N]3(C)C)(C)C.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
| Title of publication | Designing Molecular Bistability in Ruthenium Dimethyl Sulfoxide Complexes |
| Authors of publication | Aaron A. Rachford; Jeffrey L. Petersen; Jeffrey J. Rack |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Pages of publication | 8065 - 8075 |
| a | 19.8629 ± 0.0011 Å |
| b | 10.0815 ± 0.0005 Å |
| c | 16.1698 ± 0.0009 Å |
| α | 90° |
| β | 104.651 ± 0.001° |
| γ | 90° |
| Cell volume | 3132.7 ± 0.3 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0551 |
| Residual factor for significantly intense reflections | 0.0414 |
| Weighted residual factors for significantly intense reflections | 0.1061 |
| Weighted residual factors for all reflections included in the refinement | 0.1147 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.043 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4309848.html
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