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Information card for entry 4309965
Preview
Coordinates | 4309965.cif |
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Original paper (by DOI) | HTML |
Common name | Porphyrazinegalliumchloride |
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Formula | C16 Cl Ga N16 S4 |
Calculated formula | C16 Cl Ga N16 S4 |
SMILES | [Ga]123(Cl)[n]4c5=Nc6n2c(N=c2[n]3c(c3c2nsn3)N=c2c3c(nsn3)c(=Nc4c3c5nsn3)n12)c1nsnc61 |
Title of publication | Tetrakis(thiadiazole)porphyrazines. 4. Direct Template Synthesis, Structure, General Physicochemical Behavior, and Redox Properties of AlIII, GaIII, and InIII Complexes |
Authors of publication | Maria Pia Donzello; Rita Agostinetto; Svetlana S. Ivanova; Masato Fujimori; Yosuke Suzuki; Hirofumi Yoshikawa; Jing Shen; Kunio Awaga; Claudio Ercolani; Karl M. Kadish; Pavel A. Stuzhin |
Journal of publication | Inorganic Chemistry |
Year of publication | 2005 |
Journal volume | 44 |
Pages of publication | 8539 - 8551 |
a | 12.429 ± 0.003 Å |
b | 12.43 ± 0.003 Å |
c | 13.851 ± 0.003 Å |
α | 70.663 ± 0.006° |
β | 79.788 ± 0.008° |
γ | 89.991 ± 0.009° |
Cell volume | 1983.2 ± 0.8 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0862 |
Residual factor for significantly intense reflections | 0.0489 |
Weighted residual factors for significantly intense reflections | 0.1074 |
Weighted residual factors for all reflections included in the refinement | 0.126 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.01 |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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