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Information card for entry 4310094
Preview
| Coordinates | 4310094.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C38 H80 N6 Na2 O12 Se4 Tl2 |
|---|---|
| Calculated formula | C38 H80 N6 Na2 O12 Se4 Tl2 |
| Title of publication | Syntheses; 77Se, 203Tl, and 205Tl NMR; and Theoretical Studies of the Tl2Se66-, Tl3Se65-, and Tl3Se75- Anions and the X-ray Crystal Structures of [2,2,2-crypt-Na]4[Tl4Se8].en and [2,2,2-crypt-Na]2[Tl2Se4]\ιnfty1.en |
| Authors of publication | Ayaaz M. Pirani; Hélène P. A. Mercier; Reijo J. Suontamo; Gary J. Schrobilgen; David P. Santry; Horst Borrmann |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2005 |
| Journal volume | 44 |
| Pages of publication | 8770 - 8785 |
| a | 14.246 ± 0.003 Å |
| b | 14.36 ± 0.003 Å |
| c | 26.673 ± 0.005 Å |
| α | 90° |
| β | 99.87 ± 0.03° |
| γ | 90° |
| Cell volume | 5375.8 ± 1.9 Å3 |
| Cell temperature | 293 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0583 |
| Residual factor for significantly intense reflections | 0.0447 |
| Weighted residual factors for significantly intense reflections | 0.1097 |
| Weighted residual factors for all reflections included in the refinement | 0.1133 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.483 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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