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Information card for entry 4311967
Preview
Coordinates | 4311967.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C56 H80 O4 S2 V |
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Calculated formula | C56 H80 O4 S2 V |
SMILES | c12cc(C(C)(C)C)cc(c2O[V]234(Oc5c([S]12)cc(cc5C(C)(C)C)C(C)(C)C)Oc1c(cc(cc1C(C)(C)C)C(C)(C)C)[S]4c1c(O3)c(cc(c1)C(C)(C)C)C(C)(C)C)C(C)(C)C |
Title of publication | Nonoxovanadium(IV) and Oxovanadium(V) Complexes with Mixed O, X, O-Donor Ligands (X = S, Se, P, or PO) |
Authors of publication | Tapan K. Paine; Thomas Weyhermüller; Leonardo D. Slep; Frank Neese; Eckhard Bill; Eberhard Bothe; Karl Wieghardt; Phalguni Chaudhuri |
Journal of publication | Inorganic Chemistry |
Year of publication | 2004 |
Journal volume | 43 |
Pages of publication | 7324 - 7338 |
a | 19.686 ± 0.0012 Å |
b | 15.448 ± 0.0012 Å |
c | 18.1817 ± 0.0012 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 5529.2 ± 0.7 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 5 |
Space group number | 56 |
Hermann-Mauguin space group symbol | P c c n |
Hall space group symbol | -P 2ab 2ac |
Residual factor for all reflections | 0.0826 |
Residual factor for significantly intense reflections | 0.0506 |
Weighted residual factors for all reflections | 0.1483 |
Weighted residual factors for significantly intense reflections | 0.1207 |
Goodness-of-fit parameter for all reflections | 1.024 |
Goodness-of-fit parameter for significantly intense reflections | 1.088 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4311967.html
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