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Information card for entry 4312426
Preview
Coordinates | 4312426.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C42 H108 Ge2 N4 P2 Pd2 S2 Si8 |
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Calculated formula | C42 H108 Ge2 N4 P2 Pd2 S2 Si8 |
SMILES | c1ccccc1.[Pd]12([P](CC)(CC)CC)[S]3[Ge](N([Si](C)(C)C)[Si](C)(C)C)(N([Si](C)(C)C)[Si](C)(C)C)[Pd]3([P](CC)(CC)CC)[S]1[Ge]2(N([Si](C)(C)C)[Si](C)(C)C)N([Si](C)(C)C)[Si](C)(C)C |
Title of publication | Reactions of Palladium Germylene Complexes: Formation of Sulfide Bridges |
Authors of publication | Zuzanna T. Cygan; Jeff W. Kampf; Mark M. Banaszak Holl |
Journal of publication | Inorganic Chemistry |
Year of publication | 2003 |
Journal volume | 42 |
Pages of publication | 7219 - 7226 |
a | 11.287 ± 0.0013 Å |
b | 12.7506 ± 0.0015 Å |
c | 13.1569 ± 0.0015 Å |
α | 105.478 ± 0.002° |
β | 112.702 ± 0.002° |
γ | 90.475 ± 0.002° |
Cell volume | 1670.2 ± 0.3 Å3 |
Cell temperature | 158 ± 2 K |
Ambient diffraction temperature | 158 ± 2 K |
Number of distinct elements | 8 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0253 |
Residual factor for significantly intense reflections | 0.0214 |
Weighted residual factors for significantly intense reflections | 0.0544 |
Weighted residual factors for all reflections included in the refinement | 0.0566 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.065 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4312426.html
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