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Information card for entry 4312479
Preview
Coordinates | 4312479.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C32 H26 Cr N6 S8 |
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Calculated formula | C32 H26 Cr N6 S8 |
SMILES | C1(SC(=C(S1)C)C)=C1SC(=C(S1)C)C.N(=C=S)[Cr]([n]1ccc2ccccc2c1)([n]1ccc2ccccc2c1)(N=C=S)(N=C=S)N=C=S |
Title of publication | Bulk Spontaneous Magnetization in the New Radical Cation Salt TM-TTF[Cr(NCS)4(isoquinoline)2] (TM-TTF = Tetramethyltetrathiafulvalene) |
Authors of publication | M. Mas-Torrent; S. S. Turner; K. Wurst; J. Vidal-Gancedo; X. Ribas; J. Veciana; P. Day; C. Rovira |
Journal of publication | Inorganic Chemistry |
Year of publication | 2003 |
Journal volume | 42 |
Pages of publication | 7544 - 7549 |
a | 8.269 ± 0.001 Å |
b | 10.211 ± 0.002 Å |
c | 11.176 ± 0.002 Å |
α | 89.244 ± 0.009° |
β | 88.114 ± 0.009° |
γ | 74.227 ± 0.007° |
Cell volume | 907.6 ± 0.3 Å3 |
Cell temperature | 213 ± 2 K |
Ambient diffraction temperature | 213 ± 2 K |
Number of distinct elements | 5 |
Space group number | 2 |
Hermann-Mauguin space group symbol | P -1 |
Hall space group symbol | -P 1 |
Residual factor for all reflections | 0.0465 |
Residual factor for significantly intense reflections | 0.0331 |
Weighted residual factors for all reflections | 0.0791 |
Weighted residual factors for significantly intense reflections | 0.0725 |
Goodness-of-fit parameter for all reflections | 1.065 |
Goodness-of-fit parameter for significantly intense reflections | 1.109 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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