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Information card for entry 4312638
Preview
| Coordinates | 4312638.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C183 H480 Br Ga84 Li4 N20 O14 Si40 |
|---|---|
| Calculated formula | C183 H480 Br Ga83.978 Li4 N20 O14 Si40 |
| Title of publication | Preparation and Precise Structural Determination of a Second Ga84 Cluster Compound. A First Hint for Cluster Doping and Its Fundamental Consequences in the Field of Chemistry and Physics of Nanoscaled Metalloid Cluster Material |
| Authors of publication | Andreas Schnepf; Bettina Jee; Hansgeorg Schnöckel; Edgar Weckert; Alke Meents; Daniel Lübbert; Erik Herrling; Bernd Pilawa |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 7731 - 7733 |
| a | 22.466 ± 0.002 Å |
| b | 22.699 ± 0.002 Å |
| c | 22.964 ± 0.002 Å |
| α | 96.174 ± 0.017° |
| β | 114.83 ± 0.02° |
| γ | 117.04 ± 0.03° |
| Cell volume | 8797 ± 5 Å3 |
| Cell temperature | 100 ± 2 K |
| Ambient diffraction temperature | 100 ± 2 K |
| Number of distinct elements | 8 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0495 |
| Residual factor for significantly intense reflections | 0.0366 |
| Weighted residual factors for significantly intense reflections | 0.0885 |
| Weighted residual factors for all reflections included in the refinement | 0.0943 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.009 |
| Diffraction radiation wavelength | 0.36465 Å |
| Diffraction radiation type | synchrotronradiation |
| Has coordinates | Yes |
| Has disorder | Yes |
| Has Fobs | No |
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