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Information card for entry 4312791
Preview
Coordinates | 4312791.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C24 H56 O8 P4 Se8 Zn2 |
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Calculated formula | C24 H56 O8 P4 Se8 Zn2 |
SMILES | C(C)(C)OP1(OC(C)C)=[Se][Zn]2([Se]1)[Se]P(OC(C)C)(OC(C)C)=[Se][Zn]1([Se]P(OC(C)C)(OC(C)C)=[Se]1)[Se]=P(OC(C)C)(OC(C)C)[Se]2 |
Title of publication | Syntheses, Solid-State Structures, and Solution Studies by VT 31P NMR of [Zn{Se2P(OEt)2}2]∞and [Zn2{Se2P(OiPr)2}4] |
Authors of publication | Bidyut Kumar Santra; Ben-Jie Liaw; Chiu-Mine Hung; C. W. Liu; Ju-Chun Wang |
Journal of publication | Inorganic Chemistry |
Year of publication | 2003 |
Journal volume | 42 |
Pages of publication | 8866 - 8871 |
a | 11.239 ± 0.008 Å |
b | 17.396 ± 0.013 Å |
c | 25.915 ± 0.013 Å |
α | 90° |
β | 99.46 ± 0.05° |
γ | 90° |
Cell volume | 4998 ± 6 Å3 |
Cell temperature | 298 ± 2 K |
Ambient diffraction temperature | 298 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1477 |
Residual factor for significantly intense reflections | 0.0669 |
Weighted residual factors for significantly intense reflections | 0.1431 |
Weighted residual factors for all reflections included in the refinement | 0.1731 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.024 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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