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Information card for entry 4313155
Preview
Coordinates | 4313155.cif |
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Original paper (by DOI) | HTML |
Formula | Cu In3 K2 Se6 |
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Calculated formula | Cu In3 K2 Se6 |
Title of publication | K2MM'3Se6 (M = Cu, Ag; M' = Ga, In), A New Series of Metal Chalcogenides with Chain-Sublayer-Chain Slabs:\ιnfty1[M'Se4]-\ιnfty2[(MSe4)(M'Se4)]-\ιnfty1[M'Se4] |
Authors of publication | Ma, Hong-Wei; Guo, Guo-Cong; Wang, Ming-Sheng; Zhou, Guo-Wei; Lin, Shan-Hou; Dong, Zhen-Chao; Huang, Jin-Shun |
Journal of publication | Inorganic Chemistry |
Year of publication | 2003 |
Journal volume | 42 |
Journal issue | 4 |
Pages of publication | 1366 - 1370 |
a | 11.445 ± 0.002 Å |
b | 11.495 ± 0.002 Å |
c | 21.263 ± 0.004 Å |
α | 90° |
β | 97.68 ± 0.03° |
γ | 90° |
Cell volume | 2772.3 ± 0.9 Å3 |
Cell temperature | 293 ± 2 K |
Ambient diffraction temperature | 293 ± 2 K |
Number of distinct elements | 4 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.107 |
Residual factor for significantly intense reflections | 0.0676 |
Weighted residual factors for significantly intense reflections | 0.1652 |
Weighted residual factors for all reflections included in the refinement | 0.1822 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.001 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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