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Information card for entry 4313276
Preview
| Coordinates | 4313276.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Common name | strontium six gallium pentanitrate |
|---|---|
| Formula | Ga N5 Sr6 |
| Calculated formula | Ga N5 Sr6 |
| SMILES | [Ga]([N-2])([N-2])[N-2].[Sr+2].[Sr+2].[Sr+2].[N-3].[Sr+2].[Sr+2].[N-3].[Sr+2] |
| Title of publication | Synthesis and Structure of Sr3GaN3 and Sr6GaN5: Strontium Gallium Nitrides with Isolated Planar [GaN3]6- Anions |
| Authors of publication | Dong Gon Park; Zoltán A. Gál; Francis J. DiSalvo |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2003 |
| Journal volume | 42 |
| Pages of publication | 1779 - 1785 |
| a | 6.6667 ± 0.0006 Å |
| b | 6.6667 ± 0.0006 Å |
| c | 12.9999 ± 0.0017 Å |
| α | 90° |
| β | 90° |
| γ | 120° |
| Cell volume | 500.37 ± 0.09 Å3 |
| Cell temperature | 173 ± 2 K |
| Ambient diffraction temperature | 293 ± 2 K |
| Number of distinct elements | 3 |
| Space group number | 193 |
| Hermann-Mauguin space group symbol | P 63/m c m |
| Hall space group symbol | -P 6c 2 |
| Residual factor for all reflections | 0.046 |
| Residual factor for significantly intense reflections | 0.0421 |
| Weighted residual factors for significantly intense reflections | 0.0868 |
| Weighted residual factors for all reflections included in the refinement | 0.0876 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.271 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4313276.html
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