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Information card for entry 4314320
Preview
Coordinates | 4314320.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H48 N2 P4 S2 Se2 Te |
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Calculated formula | C36 H48 N2 P4 S2 Se2 Te |
SMILES | C(C)(C)P1(C(C)C)=NP(c2ccccc2)(c2ccccc2)=[Se][Te]2(S1)SP(C(C)C)(C(C)C)=NP(c1ccccc1)(c1ccccc1)=[Se]2 |
Title of publication | Synthesis and Characterization of HN(SPiPr2)(SePPh2) and [Te{N(SPiPr2)(SePPh2)}2] |
Authors of publication | Perumal Sekar; James A. Ibers |
Journal of publication | Inorganic Chemistry |
Year of publication | 2003 |
Journal volume | 42 |
Pages of publication | 6294 - 6299 |
a | 8.7931 ± 0.0005 Å |
b | 17.183 ± 0.001 Å |
c | 14.1026 ± 0.0009 Å |
α | 90° |
β | 104.696 ± 0.001° |
γ | 90° |
Cell volume | 2061.1 ± 0.2 Å3 |
Cell temperature | 153 ± 2 K |
Ambient diffraction temperature | 153 ± 2 K |
Number of distinct elements | 7 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.0479 |
Residual factor for significantly intense reflections | 0.0349 |
Weighted residual factors for significantly intense reflections | 0.0816 |
Weighted residual factors for all reflections included in the refinement | 0.0878 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.283 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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