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Information card for entry 4314656
Preview
Coordinates | 4314656.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C25 H24 N2 P S3 V |
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Calculated formula | C25 H24 N2 P S3 V |
SMILES | c1cn(c[n]1[V]123[P](c4c(ccc(c4)C)S1)(c1c(ccc(c1)C)S2)c1c(ccc(c1)C)S3)C |
Title of publication | Family of V(III)-Tristhiolato Complexes Relevant to Functional Models of Vanadium Nitrogenase: Synthesis and Electronic Structure Investigations by Means of High-Frequency and -Field Electron Paramagnetic Resonance Coupled to Quantum Chemical Computations. |
Authors of publication | Shengfa Ye; Frank Neese; Andrew Ozarowski; Dmitry Smirnov; J. Krzystek; Joshua Telser; Ju-Hsiou Liao; Chen-Hsiung Hung; Wei-Chen Chu; Yi-Feng Tsai; Rong-Chin Wang; Kun-Yuan Chen; Hua-Fen Hsu |
Journal of publication | Inorganic Chemistry |
Year of publication | 2010 |
Journal volume | 49 |
Pages of publication | 977 - 988 |
a | 8.6066 ± 0.0015 Å |
b | 21.519 ± 0.004 Å |
c | 13.877 ± 0.003 Å |
α | 90° |
β | 100.462 ± 0.004° |
γ | 90° |
Cell volume | 2527.4 ± 0.8 Å3 |
Cell temperature | 273 ± 2 K |
Ambient diffraction temperature | 273 ± 2 K |
Number of distinct elements | 6 |
Space group number | 14 |
Hermann-Mauguin space group symbol | P 1 21/n 1 |
Hall space group symbol | -P 2yn |
Residual factor for all reflections | 0.1425 |
Residual factor for significantly intense reflections | 0.062 |
Weighted residual factors for significantly intense reflections | 0.1538 |
Weighted residual factors for all reflections included in the refinement | 0.1932 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.96 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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