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Information card for entry 4314794
Preview
Coordinates | 4314794.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C36 H38 B2 Cl2 F8 P2 Pt Se2 |
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Calculated formula | C36 H38 B2 Cl2 F8 P2 Pt Se2 |
SMILES | [Pd]12([Se](c3ccccc3)CC[P]1(c1ccccc1)c1ccccc1)[Se](CC[P]2(c1ccccc1)c1ccccc1)C.[B](F)(F)(F)[F-].[B](F)(F)(F)[F-].ClCCl |
Title of publication | Selective Formation of Heteroligated Pt(II) Complexes with Bidentate Phosphine-Thioether (P,S) and Phosphine-Selenoether (P,Se) Ligands via the Halide-Induced Ligand Rearrangement Reaction |
Authors of publication | Alexander M. Spokoyny; Mari S. Rosen; Pirmin A. Ulmann; Charlotte Stern; Chad A. Mirkin |
Journal of publication | Inorganic Chemistry |
Year of publication | 2010 |
Journal volume | 49 |
Pages of publication | 1577 - 1586 |
a | 37.7059 ± 0.0006 Å |
b | 13.629 ± 0.0002 Å |
c | 17.2281 ± 0.0003 Å |
α | 90° |
β | 115.788 ± 0.001° |
γ | 90° |
Cell volume | 7971.7 ± 0.2 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 8 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.0597 |
Residual factor for significantly intense reflections | 0.0349 |
Weighted residual factors for significantly intense reflections | 0.0956 |
Weighted residual factors for all reflections included in the refinement | 0.1062 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.067 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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The link is: https://www.crystallography.net/4314794.html
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