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Information card for entry 4316996
Preview
Coordinates | 4316996.cif |
---|---|
Original paper (by DOI) | HTML |
Formula | C38 H42 Cl4 Cu6 N18 O8 |
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Calculated formula | C38 H42 Cl4 Cu6 N18 O8 |
SMILES | c1[n]2c(C(C)=[N]3[Cu]452[Cl][Cu]26([O]4(C)[Cu]4([Cl][Cu]789[N](=C(c%10cncc[n]7%10)C)O[Cu]7%10%11[Cl][Cu]%12([N](=C(c%13cncc[n]%12%13)C)O8)([O]9%10C)O[N]%11=C(c8cncc[n]78)C)([n]7ccncc7C(=[N]4O2)C)O3)[N](=C(c2cncc[n]62)C)O5)cnc1.[Cl-] |
Title of publication | Anionic Tuning of the Dimensionality in Copper Oximato Chemistry |
Authors of publication | Albert Escuer; Beatriz Cordero; Mercè Font-Bardia; Teresa Calvet |
Journal of publication | Inorganic Chemistry |
Year of publication | 2010 |
Journal volume | 49 |
Pages of publication | 9752 - 9754 |
a | 14.333 ± 0.006 Å |
b | 24.72 ± 0.01 Å |
c | 18.872 ± 0.007 Å |
α | 90° |
β | 97.282 ± 0.014° |
γ | 90° |
Cell volume | 6633 ± 5 Å3 |
Cell temperature | 100 ± 2 K |
Ambient diffraction temperature | 100 ± 2 K |
Number of distinct elements | 6 |
Space group number | 15 |
Hermann-Mauguin space group symbol | C 1 2/c 1 |
Hall space group symbol | -C 2yc |
Residual factor for all reflections | 0.1445 |
Residual factor for significantly intense reflections | 0.0853 |
Weighted residual factors for significantly intense reflections | 0.2018 |
Weighted residual factors for all reflections included in the refinement | 0.2254 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.93 |
Diffraction radiation probe | x-ray |
Diffraction radiation wavelength | 0.7107 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4316996.html
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Users of the data should acknowledge the original authors of the
structural data.