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Information card for entry 4317599
Preview
Coordinates | 4317599.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Tl[Ti(DMP)5] |
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Formula | C40 H45 O5 Ti Tl |
Calculated formula | C40 H45 O5 Ti Tl |
SMILES | c1(c(cccc1C)C)O[Ti](Oc1c(cccc1C)C)(Oc1c(cccc1C)C)(Oc1c(cccc1C)C)Oc1c(cccc1C)C.[Tl+] |
Title of publication | From Clusters to Ionic Complexes: Structurally Characterized Thallium Titanium Double Alkoxides |
Authors of publication | Timothy J. Boyle; Cecilia A. Zechmann; Todd M. Alam; Mark A. Rodriguez; Cybele A. Hijar; Brian L. Scott |
Journal of publication | Inorganic Chemistry |
Year of publication | 2002 |
Journal volume | 41 |
Pages of publication | 946 - 957 |
a | 17.1148 ± 0.0012 Å |
b | 10.5537 ± 0.0007 Å |
c | 19.649 ± 0.0013 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 3549.1 ± 0.4 Å3 |
Cell temperature | 168 ± 2 K |
Ambient diffraction temperature | 168 ± 2 K |
Number of distinct elements | 5 |
Space group number | 33 |
Hermann-Mauguin space group symbol | P n a 21 |
Hall space group symbol | P 2c -2n |
Residual factor for all reflections | 0.0475 |
Residual factor for significantly intense reflections | 0.0371 |
Weighted residual factors for significantly intense reflections | 0.0965 |
Weighted residual factors for all reflections included in the refinement | 0.1005 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.037 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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