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Information card for entry 4317955
Preview
Coordinates | 4317955.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Sn6(O)4(ONep)4 |
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Formula | C20 H44 O8 Sn6 |
Calculated formula | C20 H44 O8 Sn6 |
SMILES | [Sn]12[O]3[Sn]4([O]5[Sn]6[O]1[Sn]1([O]([Sn]3[O]1CC(C)(C)C)[Sn]5[O]4CC(C)(C)C)[O]6CC(C)(C)C)[O]2CC(C)(C)C |
Title of publication | Hydrolysis of Tin(II) Neo-pentoxide: Syntheses, Characterization, and X-ray Structures of [Sn(ONep)2]\ιnfty, Sn5(μ3-O)2(μ-ONep)6, and Sn6(μ3-O)4(μ-ONep)4 Where ONep = OCH2CMe3 |
Authors of publication | Timothy J. Boyle; Todd M. Alam; Mark A. Rodriguez; Cecilia A. Zechmann |
Journal of publication | Inorganic Chemistry |
Year of publication | 2002 |
Journal volume | 41 |
Pages of publication | 2574 - 2582 |
a | 23.777 ± 0.003 Å |
b | 23.961 ± 0.003 Å |
c | 11.985 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 6828.1 ± 1.7 Å3 |
Cell temperature | 168 ± 2 K |
Ambient diffraction temperature | 168 ± 2 K |
Number of distinct elements | 4 |
Space group number | 18 |
Hermann-Mauguin space group symbol | P 21 21 2 |
Hall space group symbol | P 2 2ab |
Residual factor for all reflections | 0.0255 |
Residual factor for significantly intense reflections | 0.0228 |
Weighted residual factors for significantly intense reflections | 0.0549 |
Weighted residual factors for all reflections included in the refinement | 0.0561 |
Goodness-of-fit parameter for all reflections included in the refinement | 1.019 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
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