Crystallography Open Database
- COD Home
- Accessing COD Data
- Add Your Data
- Documentation
Information card for entry 4318020
Preview
Coordinates | 4318020.cif |
---|---|
Original paper (by DOI) | HTML |
Common name | Dimethylaminoethylselenolato-chloro-(triethylphophine)platinum(II) |
---|---|
Formula | C10 H25 Cl N P Pt Se |
Calculated formula | C10 H25 Cl N P Pt Se |
SMILES | [Pt]1([Se]CC[N]1(C)C)(Cl)[P](CC)(CC)CC |
Title of publication | Structural Basis for Unusually Long Wavelength Charge Transfer Transitions in Complexes [MCl(ECH2CH2NMe2)(PR3)] (E = Te, Se; M = Pt, Pd): Experimental Results and TD-DFT Calculations |
Authors of publication | Sandip Dey; Vimal K. Jain; Axel Knödler; Axel Klein; Wolfgang Kaim; Stanislav Záliš |
Journal of publication | Inorganic Chemistry |
Year of publication | 2002 |
Journal volume | 41 |
Pages of publication | 2864 - 2870 |
a | 9.6374 ± 0.0019 Å |
b | 11.5216 ± 0.0016 Å |
c | 13.917 ± 0.002 Å |
α | 90° |
β | 90° |
γ | 90° |
Cell volume | 1545.3 ± 0.4 Å3 |
Cell temperature | 173 ± 2 K |
Ambient diffraction temperature | 173 ± 2 K |
Number of distinct elements | 7 |
Space group number | 19 |
Hermann-Mauguin space group symbol | P 21 21 21 |
Hall space group symbol | P 2ac 2ab |
Residual factor for all reflections | 0.0557 |
Residual factor for significantly intense reflections | 0.0424 |
Weighted residual factors for significantly intense reflections | 0.0986 |
Weighted residual factors for all reflections included in the refinement | 0.1064 |
Goodness-of-fit parameter for all reflections included in the refinement | 0.971 |
Diffraction radiation wavelength | 0.71073 Å |
Diffraction radiation type | MoKα |
Has coordinates | Yes |
Has disorder | No |
Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4318020.html
All data in the COD and the database itself are dedicated to the
public domain and licensed under the
CC0
License
.
Users of the data should acknowledge the original authors of the
structural data.