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Information card for entry 4318149
Preview
| Coordinates | 4318149.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C50 H42 F12 N4 O2 P4 Tc |
|---|---|
| Calculated formula | C50 H54 F12 N4 O2 P4 Tc |
| SMILES | CC#[N][Tc]([N]#CC)([N]#CC)([N]#CC)([P](c1ccccc1)(c1ccccc1)c1ccccc1)[P](c1ccccc1)(c1ccccc1)c1ccccc1.[P](F)(F)(F)(F)(F)[F-].O=C(C)C.[P](F)(F)(F)(F)(F)[F-].O=C(C)C |
| Title of publication | Synthesis and Characterization of Technetiumtetrakis(acetonitrile)bis(triphenylphosphine) Cationic Complexes |
| Authors of publication | Evan Freiberg; William M. Davis; Alan Davison; Alun G. Jones |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 3337 - 3339 |
| a | 16.6859 ± 0.0019 Å |
| b | 16.5534 ± 0.0018 Å |
| c | 20.086 ± 0.002 Å |
| α | 90° |
| β | 90° |
| γ | 90° |
| Cell volume | 5547.9 ± 1 Å3 |
| Cell temperature | 183 ± 2 K |
| Ambient diffraction temperature | 183 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 61 |
| Hermann-Mauguin space group symbol | P b c a |
| Hall space group symbol | -P 2ac 2ab |
| Residual factor for all reflections | 0.0891 |
| Residual factor for significantly intense reflections | 0.0497 |
| Weighted residual factors for significantly intense reflections | 0.1412 |
| Weighted residual factors for all reflections included in the refinement | 0.1566 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4318149.html
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