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Information card for entry 4318441
Preview
| Coordinates | 4318441.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C30 H46 N3 O2 Re S4 |
|---|---|
| Calculated formula | C30 N3 O2 Re S4 |
| SMILES | [Re]12(=O)(SC(C3[N]1(CC(S3)(C)C)CCN2CCN1CCOCC1)(C)C)(Sc1ccc(cc1)C)Sc1ccc(cc1)C |
| Title of publication | New Oxorhenium(V) Complexes from the Widely Used Diaminedithiol (DADT) Ligand System |
| Authors of publication | Katerina Chryssou; Maria Pelecanou; Ioannis C. Pirmettis; Minas S. Papadopoulos; Catherine Raptopoulou; Aris Terzis; Efstratios Chiotellis; Chariklia I. Stassinopoulou |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 4653 - 4663 |
| a | 15.63 ± 0.01 Å |
| b | 15.28 ± 0.02 Å |
| c | 16.07 ± 0.01 Å |
| α | 90° |
| β | 113.78 ± 0.02° |
| γ | 90° |
| Cell volume | 3512 ± 6 Å3 |
| Cell temperature | 298 K |
| Ambient diffraction temperature | 298 K |
| Number of distinct elements | 6 |
| Space group number | 14 |
| Hermann-Mauguin space group symbol | P 1 21/c 1 |
| Hall space group symbol | -P 2ybc |
| Residual factor for all reflections | 0.0613 |
| Residual factor for significantly intense reflections | 0.0452 |
| Weighted residual factors for all reflections | 0.1278 |
| Weighted residual factors for significantly intense reflections | 0.1154 |
| Goodness-of-fit parameter for all reflections | 1.105 |
| Goodness-of-fit parameter for significantly intense reflections | 1.14 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4318441.html
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Users of the data should acknowledge the original authors of the
structural data.