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Information card for entry 4318552
Preview
| Coordinates | 4318552.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C12 H10 Cl2 N2 O4 Pd |
|---|---|
| Calculated formula | C12 H10 Cl2 N2 O4 Pd |
| SMILES | c1cc(C(=O)O)cc[n]1[Pd]([n]1ccc(C(=O)O)cc1)(Cl)Cl |
| Title of publication | Self-Assembly of Polymer and Sheet Structures in Palladium(II) Complexes Containing Carboxylic Acid Substituents |
| Authors of publication | Zengquan Qin; Michael C. Jennings; Richard J. Puddephatt; Kenneth W. Muir |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 5174 - 5186 |
| a | 3.9554 ± 0.0002 Å |
| b | 7.483 ± 0.0004 Å |
| c | 12.5456 ± 0.0007 Å |
| α | 75.625 ± 0.003° |
| β | 88.898 ± 0.003° |
| γ | 80.313 ± 0.003° |
| Cell volume | 354.47 ± 0.03 Å3 |
| Cell temperature | 295 ± 2 K |
| Ambient diffraction temperature | 295 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0271 |
| Residual factor for significantly intense reflections | 0.0238 |
| Weighted residual factors for all reflections | 0.0607 |
| Weighted residual factors for significantly intense reflections | 0.0582 |
| Goodness-of-fit parameter for all reflections | 1.021 |
| Goodness-of-fit parameter for significantly intense reflections | 1.009 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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The link is: https://www.crystallography.net/4318552.html
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