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Information card for entry 4318554
Preview
| Coordinates | 4318554.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C16 H22 Cl2 N2 O6 Pd S2 |
|---|---|
| Calculated formula | C16 H22 Cl2 N2 O6 Pd S2 |
| SMILES | O=S(C)C.[Pd]([n]1cc(C(=O)O)ccc1)([n]1cc(C(=O)O)ccc1)(Cl)Cl.O=S(C)C |
| Title of publication | Self-Assembly of Polymer and Sheet Structures in Palladium(II) Complexes Containing Carboxylic Acid Substituents |
| Authors of publication | Zengquan Qin; Michael C. Jennings; Richard J. Puddephatt; Kenneth W. Muir |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 5174 - 5186 |
| a | 4.7722 ± 0.001 Å |
| b | 10.139 ± 0.002 Å |
| c | 12.788 ± 0.003 Å |
| α | 107.353 ± 0.01° |
| β | 90.549 ± 0.01° |
| γ | 96.331 ± 0.01° |
| Cell volume | 586.4 ± 0.2 Å3 |
| Cell temperature | 294 ± 2 K |
| Ambient diffraction temperature | 294 ± 2 K |
| Number of distinct elements | 7 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0306 |
| Residual factor for significantly intense reflections | 0.0278 |
| Weighted residual factors for all reflections | 0.0784 |
| Weighted residual factors for significantly intense reflections | 0.0769 |
| Goodness-of-fit parameter for all reflections | 1.065 |
| Goodness-of-fit parameter for significantly intense reflections | 1.086 |
| Diffraction radiation wavelength | 0.71073 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4318554.html
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