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Information card for entry 4318556
Preview
| Coordinates | 4318556.cif |
|---|---|
| Original paper (by DOI) | HTML |
| Formula | C32 H22 Cl2 N2 O4 Pd |
|---|---|
| Calculated formula | C32 H22 Cl2 N2 O4 Pd |
| SMILES | [Pd]([n]1c(cc(c2c1cccc2)C(=O)O)c1ccccc1)([n]1c(cc(c2c1cccc2)C(=O)O)c1ccccc1)(Cl)Cl |
| Title of publication | Self-Assembly of Polymer and Sheet Structures in Palladium(II) Complexes Containing Carboxylic Acid Substituents |
| Authors of publication | Zengquan Qin; Michael C. Jennings; Richard J. Puddephatt; Kenneth W. Muir |
| Journal of publication | Inorganic Chemistry |
| Year of publication | 2002 |
| Journal volume | 41 |
| Pages of publication | 5174 - 5186 |
| a | 8.145 ± 0.002 Å |
| b | 9.422 ± 0.0019 Å |
| c | 10.092 ± 0.002 Å |
| α | 65.601 ± 0.0016° |
| β | 75.142 ± 0.002° |
| γ | 78.015 ± 0.003° |
| Cell volume | 677.2 ± 0.3 Å3 |
| Cell temperature | 150 ± 2 K |
| Ambient diffraction temperature | 150 ± 2 K |
| Number of distinct elements | 6 |
| Space group number | 2 |
| Hermann-Mauguin space group symbol | P -1 |
| Hall space group symbol | -P 1 |
| Residual factor for all reflections | 0.0364 |
| Residual factor for significantly intense reflections | 0.0353 |
| Weighted residual factors for significantly intense reflections | 0.0949 |
| Weighted residual factors for all reflections included in the refinement | 0.0954 |
| Goodness-of-fit parameter for all reflections included in the refinement | 1.017 |
| Diffraction radiation wavelength | 0.6915 Å |
| Diffraction radiation type | X-rays |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
For the version history of this entry, please navigate to main COD server.
The link is: https://www.crystallography.net/4318556.html
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